HOME > 論文 > 書誌詳細Tuning minority-carrier lifetime through stacking fault defects: The case of polytypic SiCBin Chen, Hirofumi Matsuhata, Takashi Sekiguchi, Akimasa Kinoshita, Kyouichi Ichinoseki, Hajime Okumura. Applied Physics Letters 100 [13] 132108. 2012.https://doi.org/10.1063/1.3700963 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:40:20 +0900更新時刻: 2024-03-31 12:40:57 +0900
