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Direct observation of the depairing current density in single-crystalline Ba0.5K0.5Fe2As2 microbridge with nanoscale thickness
(Direct observation of the depairing current density in single-crystalline Ba0.5K0.5Fe2As2 microbridge with nanoscale thickness)

Jun Li, Jie Yuan, Ya-Hua Yuan, Jun-Yi Ge, Meng-Yue Li, Hai-Luke Feng, Paulo J. Pereira, Akira Ishii, Takeshi Hatano, Alejandro V. Silhanek, Liviu F. Chibotaru, Johan Vanacken, Kazunari Yamaura, Hua-Bing Wang, Eiji Takayama-Muromachi, Victor V. Moshchalkov.
Applied Physics Letters 103 [6] 062603. 2013.

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      作成時刻: 2016-05-24 17:07:39 +0900更新時刻: 2024-06-02 06:47:51 +0900

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