Direct observation of the depairing current density in single-crystalline Ba0.5K0.5Fe2As2 microbridge with nanoscale thickness

Direct observation of the depairing current density in single-crystalline Ba0.5K0.5Fe2As2 microbridge with nanoscale thickness
(Direct observation of the depairing current density in single-crystalline Ba0.5K0.5Fe2As2 microbridge with nanoscale thickness)

著者	Jun Li, Jie Yuan, Ya-Hua Yuan, Jun-Yi Ge, Meng-Yue Li, Hai-Luke Feng, Paulo J. Pereira, Akira Ishii, Takeshi Hatano, Alejandro V. Silhanek, Liviu F. Chibotaru, Johan Vanacken, Kazunari Yamaura, Hua-Bing Wang, Eiji Takayama-Muromachi, Victor V. Moshchalkov.
掲載誌名	Applied Physics Letters 103 [6] 062603 ISSN: 00036951, 10773118 ESIでのカテゴリ: PHYSICS
出版社	AIP Publishing
発表年	2013
言語	English
DOI	https://doi.org/10.1063/1.4818127
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