Direct observation of the depairing current density in single-crystalline Ba0.5K0.5Fe2As2 microbridge with nanoscale thickness

Jun Li; Jie Yuan; Ya-Hua Yuan; Jun-Yi Ge; Meng-Yue Li; Hai-Luke Feng; Paulo J. Pereira; Akira Ishii; Takeshi Hatano; Alejandro V. Silhanek; Liviu F. Chibotaru; Johan Vanacken; Kazunari Yamaura; Hua-Bing Wang; Eiji Takayama-Muromachi; Victor V. Moshchalkov; Jun Li; Jie Yuan; Ya-Hua Yuan; Jun-Yi Ge; Meng-Yue Li; Hai-Luke Feng; Paulo J. Pereira; Akira Ishii; Takeshi Hatano; Alejandro V. Silhanek; Liviu F. Chibotaru; Johan Vanacken; Kazunari Yamaura; Hua-Bing Wang; Eiji Takayama-Muromachi; Victor V. Moshchalkov

doi:10.1063/1.4818127

Direct observation of the depairing current density in single-crystalline Ba0.5K0.5Fe2As2 microbridge with nanoscale thickness
(Direct observation of the depairing current density in single-crystalline Ba0.5K0.5Fe2As2 microbridge with nanoscale thickness)

Jun Li, Jie Yuan, Ya-Hua Yuan, Jun-Yi Ge, Meng-Yue Li, Hai-Luke Feng, Paulo J. Pereira, Akira Ishii, Takeshi Hatano, Alejandro V. Silhanek, Liviu F. Chibotaru, Johan Vanacken, Kazunari Yamaura, Hua-Bing Wang, Eiji Takayama-Muromachi, Victor V. Moshchalkov.

Applied Physics Letters 103 [6] 062603. 2013.

https://doi.org/10.1063/1.4818127

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 17:07:39 +0900Updated at: 2024-03-31 13:25:06 +0900

Direct observation of the depairing current density in single-crystalline Ba0.5K0.5Fe2As2 microbridge with nanoscale thickness(Direct observation of the depairing current density in single-crystalline Ba0.5K0.5Fe2As2 microbridge with nanoscale thickness)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Direct observation of the depairing current density in single-crystalline Ba0.5K0.5Fe2As2 microbridge with nanoscale thickness
(Direct observation of the depairing current density in single-crystalline Ba0.5K0.5Fe2As2 microbridge with nanoscale thickness)