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Electrical characteristics and thermal stability of HfO2 metal-oxide-semiconductor capacitors fabricated on clean reconstructed GaSb surfaces
(Electrical characteristics and thermal stability of HfO2 metal-oxide-semiconductor capacitors fabricated on clean reconstructed GaSb surfaces)

Noriyuki Miyata, Akihiro Ohtake, Masakazu Ichikawa, Takahiro Mori, Tetsuji Yasuda.
Applied Physics Letters 104 [23] 232104. 2014.
https://doi.org/10.1063/1.4882643

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      作成時刻: 2016-05-24 17:25:49 +0900更新時刻: 2024-03-31 13:45:00 +0900

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