Electrical characteristics and thermal stability of HfO2 metal-oxide-semiconductor capacitors fabricated on clean reconstructed GaSb surfaces

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Electrical characteristics and thermal stability of HfO₂ metal-oxide-semiconductor capacitors fabricated on clean reconstructed GaSb surfaces
(Electrical characteristics and thermal stability of HfO2 metal-oxide-semiconductor capacitors fabricated on clean reconstructed GaSb surfaces)

Noriyuki Miyata, Akihiro Ohtake, Masakazu Ichikawa, Takahiro Mori, Tetsuji Yasuda.

作成時刻: 2016-05-24 17:25:49 +0900 更新時刻: 2026-09-29 07:00:37 +0900