Electrical characteristics and thermal stability of HfO2 metal-oxide-semiconductor capacitors fabricated on clean reconstructed GaSb surfaces
(Electrical characteristics and thermal stability of HfO2 metal-oxide-semiconductor capacitors fabricated on clean reconstructed GaSb surfaces)
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Created at: 2016-05-24 17:25:49 +0900Updated at: 2024-03-31 13:45:00 +0900