Development of thermally stable N-doped multielement dielectrics and their boost in electrical and UV-sensing performances of resulting dual-gate thin film transistors | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Development of thermally stable N-doped multielement dielectrics and their boost in electrical and UV-sensing performances of resulting dual-gate thin film transistors

Van Dung Nguyen, Chun-Ting Tai, Takahiro Nagata, K.-S. Chang.

Applied Surface Science 745 167471. 2026.

https://doi.org/10.1016/j.apsusc.2026.167471

NIMS著者

長田貴弘

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2026-06-27 03:07:05 +0900 更新時刻: 2026-08-29 06:05:48 +0900

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