HOME > 論文 > 書誌詳細Microvoid formation in hydrogen-implanted ZnO probed by a slow positron beamZ. Q. Chen, A. Kawasuso, Y. Xu, H. Naramoto, X. L. Yuan, T. Sekiguchi, R. Suzuki, T. Ohdaira. Physical Review B 71 [11] 115213. 2005.https://doi.org/10.1103/physrevb.71.115213 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 14:46:24 +0900更新時刻: 2024-04-01 22:04:38 +0900
