Study of Crystallographic Orientation of in situ β-Si3N4 Composite by Electron Back Scattered Diffraction (EBSD) Method | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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(Study of Crystallographic Orientation of in situ β-Si3N4 Composite by Electron Back Scattered Diffraction (EBSD) Method)

安富義幸, 坂井田喜久, HIROSAKI, Naoto, 幾原雄一.

Key Enginnering Materials 31-34. 1999.

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廣崎尚登

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2022-09-05 10:52:52 +0900更新時刻: 2022-09-05 10:52:52 +0900

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