HOME > Article > Detail走査トンネル顕微鏡によるナノ構造の創製と解析(Nano-Fabrication and Nano-Characterization by Scanning Tunneling Microscopy)藤田 大介, 鷺坂 恵介, 大木 泰造. まてりあ 43 [9] 724-729. 2004.NIMS author(s)FUJITA, DaisukeSAGISAKA, KeisukeFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 14:32:08 +0900Updated at: 2018-12-14 22:54:35 +0900