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走査トンネル顕微鏡によるナノ構造の創製と解析
(Nano-Fabrication and Nano-Characterization by Scanning Tunneling Microscopy)

藤田 大介, 鷺坂 恵介, 大木 泰造.
まてりあ 43 [9] 724-729. 2004.

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