HOME > 論文 > 書誌詳細The low-energy electron point source microscope as a tool for transport measurements of free-standing nanometer scale objects: aPavel Dorozhkin, 根城均, D. Fujita, P. Dorozhkin, H. Nejoh. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 20 [3] 1044. 2002.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 11:46:00 +0900 更新時刻: 2019-01-05 01:25:43 +0900
