HOME > Article > Detail Endurance of magnetic tunnel junctions under dynamic voltage stress C.M. Choi, H. Sukegawa, S. Mitani, Y.H. Song. Electronics Letters 53 [16] 1146-1148. 2017.https://doi.org/10.1049/el.2017.1579 NIMS author(s)SUKEGAWA, HiroakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-11-08 21:25:14 +0900 Updated at: 2026-11-04 06:35:53 +0900
