HOME > 論文 > 書誌詳細 Endurance of magnetic tunnel junctions under dynamic voltage stress C.M. Choi, H. Sukegawa, S. Mitani, Y.H. Song. Electronics Letters 53 [16] 1146-1148. 2017.https://doi.org/10.1049/el.2017.1579 NIMS著者介川 裕章三谷 誠司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-11-08 21:25:14 +0900更新時刻: 2024-10-10 06:45:19 +0900
