HOME > 論文 > 書誌詳細Determination of interface roughness of Gd films deposited on Si surface using improved wavelet transform of X-ray reflectivity Oleksiy, STARYKOV, SAKURAI, Kenji. APPLIED SURFACE SCIENCE 235-239. 2005.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-10-21 22:02:05 +0900 更新時刻: 2022-10-21 22:02:05 +0900
