HOME > 論文 > 書誌詳細Degradation Characteristics of MgO Based Magnetic Tunnel Junction Caused by Surface Roughness of Ta/Ru Buffer LayersJung Min Lee, Chul Min Choi, Hiroaki Sukegawa, Jeong Yong Lee, Seiji Mitani, Yun-Heub Song. Journal of Nanoscience and Nanotechnology 16 [1] 654-657. 2016.https://doi.org/10.1166/jnn.2016.11901 NIMS著者介川 裕章三谷 誠司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 18:07:41 +0900更新時刻: 2024-09-06 05:23:48 +0900
