HOME > 論文 > 書誌詳細Atomic-scale characterization of the N incorporation on GaAs(001)Akihiro Ohtake. Journal of Applied Physics 110 [3] 033506. 2011.https://doi.org/10.1063/1.3609066 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:26:01 +0900 更新時刻: 2026-09-29 06:47:33 +0900
