HOME > Article > DetailAtomic-scale characterization of the N incorporation on GaAs(001)Akihiro Ohtake. Journal of Applied Physics 110 [3] 033506. 2011.https://doi.org/10.1063/1.3609066 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:26:01 +0900Updated at: 2024-03-31 13:12:41 +0900
