HOME > 論文 > 書誌詳細An extensive theoretical quantification of secondary electron emission from siliconM.S.S. Khan, S.F. Mao, Y.B. Zou, D.B. Lu, B. Da, Y.G. Li, Z.J. Ding. Vacuum 215 112257. 2023.https://doi.org/10.1016/j.vacuum.2023.112257 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2023-11-01 03:13:44 +0900 更新時刻: 2026-10-08 08:52:49 +0900
