Characterization by X-Ray Diffraction of Non- <inline-formula> <tex-math notation="LaTeX">$c$</tex-math> </inline-formula>-Axis Epitaxial <inline-formula> <tex-math notation="LaTeX">${Bi}_{2}{Sr}_{2}{CaCu}_{2}{O}_{8+\delta}$</tex-math> </inline-formula> Thin Films | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Characterization by X-Ray Diffraction of Non- $c$ -Axis Epitaxial ${Bi}_{2}{Sr}_{2}{CaCu}_{2}{O}_{8+\delta}$ Thin Films
(Characterization by X-ray Diffraction of Non-c-axis Epitaxial Bi2Sr2CaCu2O8+d Thin Films)

K. Endo, S. Arisawa, T. Kaneko, I. Tsuyumoto, Y. Tateno, P. Badica.

IEEE Transactions on Applied Superconductivity 26 [3] 1-4. 2016.

https://doi.org/10.1109/tasc.2016.2529005

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作成時刻: 2016-05-24 18:02:44 +0900更新時刻: 2024-04-02 00:33:41 +0900

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