Characterization by X-Ray Diffraction of Non- $c$ -Axis Epitaxial ${Bi}_{2}{Sr}_{2}{CaCu}_{2}{O}_{8+\delta}$ Thin Films
(Characterization by X-ray Diffraction of Non-c-axis Epitaxial Bi2Sr2CaCu2O8+d Thin Films)

著者	K. Endo, S. Arisawa, T. Kaneko, I. Tsuyumoto, Y. Tateno, P. Badica.
掲載誌名	IEEE Transactions on Applied Superconductivity 26 [3] 1-4 ISSN: 10518223 ESIでのカテゴリ: PHYSICS
出版社	Institute of Electrical and Electronics Engineers (IEEE)
発表年	2016
言語	English
DOI	https://doi.org/10.1109/tasc.2016.2529005
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Characterization by X-Ray Diffraction of Non- $c$ -Axis Epitaxial ${Bi}_{2}{Sr}_{2}{CaCu}_{2}{O}_{8+\delta}$ Thin Films(Characterization by X-ray Diffraction of Non-c-axis Epitaxial Bi2Sr2CaCu2O8+d Thin Films)