Polarization analysis of terahertz emission from Bi-2212 cross-whisker intrinsic Josephson junction devices and their refractive index | SAMURAI, NIMS Researchers Directory Service

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Polarization analysis of terahertz emission from Bi-2212 cross-whisker intrinsic Josephson junction devices and their refractive index

Y. Saito, I. Kakeya, Y. Takano.

Applied Physics Letters 121 [21] . 2022.

https://doi.org/10.1063/5.0123290

NIMS author(s)

TAKANO, Yoshihiko

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-12-15 03:23:21 +0900Updated at: 2024-05-01 08:36:06 +0900

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