The Fourier images feature of the lattice fringes formed by low-loss electrons as observed using spatially-resolved EELS techniq | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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The Fourier images feature of the lattice fringes formed by low-loss electrons as observed using spatially-resolved EELS techniq
(低エネルギー損失電子が形成する格子縞にみられるフーリエ像的性質)

KIMOTO, Koji, MATSUI, Yoshio.

Journal of Electron Microscopy . 2001.

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Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2022-09-05 11:06:59 +0900更新時刻: 2022-09-05 11:06:59 +0900

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