HOME > 論文 > 書誌詳細Defects and transport in complex oxide thin filmsTsuyoshi Ohnishi, Keisuke Shibuya, Takahisa Yamamoto, Mikk Lippmaa. Journal of Applied Physics 103 [10] 103703. 2008.https://doi.org/10.1063/1.2921972 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:42:50 +0900 更新時刻: 2026-11-02 05:40:21 +0900
