HOME > Article > DetailDefects and transport in complex oxide thin filmsTsuyoshi Ohnishi, Keisuke Shibuya, Takahisa Yamamoto, Mikk Lippmaa. Journal of Applied Physics 103 [10] 103703. 2008.https://doi.org/10.1063/1.2921972 NIMS author(s)OHNISHI, TsuyoshiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:42:50 +0900Updated at: 2025-03-13 05:38:50 +0900
