HOME > 論文 > 書誌詳細Analysis of local strain fields around individual threading dislocations in GaN substrates by nanobeam x-ray diffractionT. Hamachi, T. Tohei, Y. Hayashi, S. Usami, M. Imanishi, Y. Mori, K. Sumitani, Y. Imai, S. Kimura, A. Sakai. Journal of Applied Physics 135 [22] 225702. 2024.https://doi.org/10.1063/5.0199961 Open Access AIP Publishing (Publisher) Materials Data Repository (MDR) NIMS著者林 侑介Materials Data Repository (MDR)上の本文・データセットMDRavailable Analysis of local strain fields around individual threading dislocations in GaN substrates by nanobeam x-ray diffraction 作成時刻: 2024-11-30 03:15:56 +0900更新時刻: 2024-12-01 03:16:03 +0900
