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Analysis of local strain fields around individual threading dislocations in GaN substrates by nanobeam x-ray diffraction

T. Hamachi, T. Tohei, Y. Hayashi, S. Usami, M. Imanishi, Y. Mori, K. Sumitani, Y. Imai, S. Kimura, A. Sakai.

Journal of Applied Physics 135 [22] 225702. 2024.

https://doi.org/10.1063/5.0199961

Open Access AIP Publishing (Publisher) Materials Data Repository (MDR)

NIMS author(s)

HAYASHI, Yusuke

Fulltext and dataset(s) on Materials Data Repository (MDR)

MDRavailable Analysis of local strain fields around individual threading dislocations in GaN substrates by nanobeam x-ray diffraction

Created at: 2024-11-30 03:15:56 +0900 Updated at: 2026-09-23 04:32:15 +0900

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