HOME > 論文 > 書誌詳細Degradation of REBCO conductors caused by the screening currentD X Ma, Z Y Zhang, S Matsumoto, R Teranishi, T Kiyoshi. Superconductor Science and Technology 26 [10] 105018. 2013.https://doi.org/10.1088/0953-2048/26/10/105018 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻 :2016-05-24 17:05:13 +0900 更新時刻 :2022-09-05 13:50:19 +0900