HOME > Article > DetailDegradation of REBCO conductors caused by the screening currentD X Ma, Z Y Zhang, S Matsumoto, R Teranishi, T Kiyoshi. Superconductor Science and Technology 26 [10] 105018. 2013.https://doi.org/10.1088/0953-2048/26/10/105018 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 17:05:13 +0900Updated at: 2024-04-02 04:55:58 +0900
