Universal scaling behavior of the upper critical field in strained FeSe0.7Te0.3 thin films

Feifei Yuan; Vadim Grinenko; Kazumasa Iida; Stefan Richter; Aurimas Pukenas; Werner Skrotzki; Masahito Sakoda; Michio Naito; Alberto Sala; Marina Putti; Aichi Yamashita; Yoshihiko Takano; Zhixiang Shi; Kornelius Nielsch; Ruben Hühne

doi:10.1088/1367-2630/aade66

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Universal scaling behavior of the upper critical field in strained FeSe0.7Te0.3 thin films

Feifei Yuan, Vadim Grinenko, Kazumasa Iida, Stefan Richter, Aurimas Pukenas, Werner Skrotzki, Masahito Sakoda, Michio Naito, Alberto Sala, Marina Putti, Aichi Yamashita, Yoshihiko Takano, Zhixiang Shi, Kornelius Nielsch, Ruben Hühne.

New Journal of Physics 20 [9] 093012. 2018.

https://doi.org/10.1088/1367-2630/aade66

Open Access IOP Publishing (Publisher)

NIMS著者

高野義彦

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2019-03-04 09:36:23 +0900更新時刻: 2024-03-31 01:13:07 +0900