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Universal scaling behavior of the upper critical field in strained FeSe0.7Te0.3 thin films

著者Feifei Yuan, Vadim Grinenko, Kazumasa Iida, Stefan Richter, Aurimas Pukenas, Werner Skrotzki, Masahito Sakoda, Michio Naito, Alberto Sala, Marina Putti, Aichi Yamashita, Yoshihiko Takano, Zhixiang Shi, Kornelius Nielsch, Ruben Hühne.
掲載誌名NEW JOURNAL OF PHYSICS 20 [9] 093012-1-093012-9
ISSN: 13672630
ESIでのカテゴリ: PHYSICS
出版社
発表年2018
言語English
DOIhttps://doi.org/10.1088/1367-2630/aade66
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