HOME > 論文 > 書誌詳細High-Resolution Electron Microscopy of Planar Defects and Dislocation in Ba2YCu3Oy松井良夫, MUROMACHI, Eiji, 加藤克夫. Japanese Journal of Applied Physics 350. 1988.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 10:29:21 +0900 更新時刻: 2022-09-05 10:29:21 +0900
