HOME > 論文 > 書誌詳細High-Resolution Electron Microscopy of Radiation Damage of YBa2Cu4Oy Superconductor Induced by 200KV Electron Beam松井良夫, 柳澤佳寿美. Japanese Journal of Applied Physics 29. 1992.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 10:34:35 +0900更新時刻: 2022-09-05 10:34:35 +0900
