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Assessment of lower-voltage TEM performance using 3D Fourier transform of through-focus series

Koji Kimoto, Keiji Kurashima, Takuro Nagai, Megumi Ohwada, Kazuo Ishizuka.
Ultramicroscopy 121 31-37. 2012.

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      作成時刻: 2016-05-24 16:45:14 +0900更新時刻: 2024-04-02 03:15:51 +0900

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