HOME > Article > DetailAssessment of lower-voltage TEM performance using 3D Fourier transform of through-focus seriesKoji Kimoto, Keiji Kurashima, Takuro Nagai, Megumi Ohwada, Kazuo Ishizuka. Ultramicroscopy 121 31-37. 2012.https://doi.org/10.1016/j.ultramic.2012.06.012 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:45:14 +0900 Updated at: 2026-10-08 05:09:38 +0900
