In situ spectroscopic measurement of defect formation in SiO_2 induced by femtosecond laser irradiation
(フェムト秒レーザ照射により誘起されたSiO2の欠陥生成のその場分光測定)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2022-11-15 00:40:49 +0900 Updated at: 2022-11-15 00:40:49 +0900