HOME > 会議録 > 書誌詳細Study of metal ion implanted and subsequently annealed rutile (001) surface morphology by atomic force microscopeOYOSHI, Keiji. Proceedings of Japan-UK Joint Workshop on Kankyo Semiconductors . 2000.NIMS著者大吉 啓司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 11:00:48 +0900更新時刻: 2022-09-05 11:00:48 +0900
