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Investigation of domain distribution in patterned PZT thin films using Raman spectroscopy
(ラマン分光法によるパターニングされたPZT薄膜のドメイン分布評価)

Ken Nishida, OSADA, Minoru, Shintaro Yokoyama, TAKAHASHI. Kenji, Hiroshi Funakubo, Takashi Katoda.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-27 00:59:31 +0900Updated at: 2017-03-17 02:59:43 +0900

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