Deep Defect Detection Using Eddy Current Testing with AMR Sensor | SAMURAI, NIMS Researchers Directory Service

Scheduled downtime (October 31st and November 1st, 2026) (2026-10-29)

HOME > Proceedings > Detail

Deep Defect Detection Using Eddy Current Testing with AMR Sensor

HE, Dongfeng, SHIWA, Mitsuharu.

PIERS PROCEEDINGS 493-495. 2013.

NIMS author(s)

HE, Dongfeng

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2017-02-27 02:25:34 +0900 Updated at: 2017-03-17 04:36:36 +0900

▲ Go to the top of this page