HOME > 会議録 > 書誌詳細Deep Defect Detection Using Eddy Current Testing with AMR SensorHE, Dongfeng, SHIWA, Mitsuharu. PIERS PROCEEDINGS 493-495. 2013.NIMS著者何 東風Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-27 02:25:34 +0900更新時刻: 2017-03-17 04:36:36 +0900
