HOME > 会議録 > 書誌詳細Study of Thin Film Systems Using First Principles ApproachOSHIKIRI, Mitsutake. Proceedings of the 4th NIMS Int. Conf. on Photo. Proc. in Semicon. Nano. 77-78. 2006.NIMS著者押切 光丈Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-27 01:02:23 +0900更新時刻: 2017-03-17 03:02:27 +0900
