HOME > 会議録 > 書誌詳細High-Resolution Transmission Electron Microscope Study of Electron-Bean Induced Damage in Some Oxide Superconductors松井良夫, 柳澤佳寿美. Materials Research Society Symposium Proceedings 635-646. 1992.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 10:34:35 +0900 更新時刻: 2022-09-05 10:34:35 +0900
