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NIMS Award Symposium 2026

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Structural Defects in GaN-based Materials and Their Relation to GaN-based Laser Diodes

Shigetaka Tomiya, Masao Ikeda, Shinji Tanaka, Yuya Kanitani, Tadakatsu Ohkubo, Kazuhiro Hono.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-27 01:59:44 +0900 Updated at: 2026-11-04 05:13:23 +0900

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