HOME > Proceedings > DetailStructural Defects in GaN-based Materials and Their Relation to GaN-based Laser DiodesShigetaka Tomiya, Masao Ikeda, Shinji Tanaka, Yuya Kanitani, Tadakatsu Ohkubo, Kazuhiro Hono. Mater.Res.Soc.Symp.Proc. 05-05-9. 2009.https://doi.org/10.1557/proc-1195-b01-05 NIMS author(s)OHKUBO, TadakatsuHONO, KazuhiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-27 01:59:44 +0900 Updated at: 2026-11-04 05:13:23 +0900