HOME > Presentation > DetailSTEM-ADF像の定量解析を可能とする計測・解析技術(Advanced Techniques for Quantitative STEM-ADF imaging)木本 浩司, 山下 俊介, 越谷 翔悟, 石塚 和夫. 第72回学術講演会. June 14, 2016-June 16, 2016.NIMS author(s)KIMOTO, KojiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:18:39 +0900 Updated at: 2017-07-10 22:22:54 +0900