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Grazing Incidence X-ray Reflectance Measurement of Surface and Interface Roughness on the Sub-Nanometer Scale.
(斜入射X線反射率法によるサブナノメータスケールの表面および界面ラフネスの測定.)
MRS Fall Meeting. November 29, 1993-December 04, 1993.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:44:29 +0900 Updated at: 2017-07-10 17:26:35 +0900