HOME > Presentation > Detail
In-situ Electron Microscopy of Secondary Defects in Ni Induced by H+ and Ar+ Irradiation in TEM
(水素イオン及びアルゴンイオン照射によってニッケル中に導入された二次欠陥の電顕内その場観察)
第１３回国際電子顕微鏡学会. July 17, 1994-July 22, 1994.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-18 00:51:10 +0900 Updated at: 2017-07-10 17:29:27 +0900