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Au0.18Ge0.82 薄膜温度計とRuO2厚膜温度計の磁気抵抗の比較
(Comparatire Magnetoresistance of Au0.18Ge0.82 Thin Film and RuO2 Thick Film Thermemefers,)
アメリカ物理学会. March 20, 1999-March 26, 1999.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:02:59 +0900 Updated at: 2017-07-10 17:52:36 +0900