HOME > Presentation > Detail透過電子顕微鏡による強磁性トンネル接合の解析(TEM analysis in magnetic tunneling junctions)中谷 友也, 高橋 有紀子, 猪俣 浩一郎, 宝野 和博. 日本応用磁気学会第31学術講演会. September 11, 2007-September 14, 2007.NIMS author(s)NAKATANI, TomoyaTAKAHASHI, YukikoHONO, KazuhiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:39:04 +0900Updated at: 2017-07-10 19:59:48 +0900