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XPS線分析による層状界面層の組成・結合エネルギー測定
(Measurement of composition and binding energy of layered interfacial phases by XPS line scanning)
日本表面科学会. December 02, 1997-December 04, 1997.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-18 01:21:43 +0900 Updated at: 2017-07-10 17:45:15 +0900