HOME > Presentation > Detail
Force spectroscopy and AFM imaging to investigate ceria surfaces at the atomic scale
ConForce-26 (Fourth Conference on Force Spectroscopy and Microscopy). June 11, 2026-June 14, 2026. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2026-07-18 03:08:46 +0900 Updated at: 2026-07-18 03:08:46 +0900