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Ag/ZnO接合薄膜の加熱処理における界面電子状態評価
(Effect of post-deposition annealing of electronic states properties of interface in Ag / ZnO multi-layers)
第57回セラミックス基礎科学討論会. January 16, 2019-January 17, 2019.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2019-03-04 09:36:32 +0900 Updated at: 2019-03-04 09:36:32 +0900