HOME > Presentation > DetailDevelopment and Application of “Soft” Probe for Various Types of Electric MeasurementsYOSHITAKE, Michiko, Yusuke Nakaune, Kentaro Kinoshita. 8th International Symposium on Practical Surface Analysis. November 03, 2019-November 08, 2019.NIMS author(s)YOSHITAKE, MichikoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2020-01-10 03:00:26 +0900 Updated at: 2020-01-10 03:00:26 +0900