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電子顕微鏡内照射下での半導体の欠陥形成の直接観察.
(Direct Observation of Defects Formation of Semiconductors During the Irradiation in the Electron Microscope.)
第2回SAMPE国際会議. December 11, 1991-December 14, 1991.
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-18 00:23:04 +0900 Updated at: 2017-07-10 17:12:35 +0900