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電子線リソグラフィーと集束イオンビームを用いた局所クリープ変形の計測と粒界挙動の観察
(Measurement of localized creep deformation and observation of grain boundary behavior using electron beam lithography and foused)
日本学術会議材料研究連合講演会. September 18, 1997-September 19, 1997.
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Created at: 2017-02-18 01:16:55 +0900 Updated at: 2017-07-10 17:42:45 +0900