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Quantiatve Comparison between AES and SIMs Depth Projiles of a GaAs/ALAs Multilayer Structure using the MRI-model.
(MRIモデルを使用するGaAsLALAs多層構造におけるAES及びSIMS深さプロファイルの定量比較)
KVS-SAAJ Joint Meeting (Korean Vacum Society-Surface Analysis \a. 1998-10-22.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-18 01:34:05 +0900 Updated at: 2018-06-22 10:43:45 +0900