Cross-Sectional TEM Specimen Preparation by Merging Wedge-Polishing with FIB Milling for the Nano-wires Grown on Various Substrates
6th International Symposium on Atomic Level Characterizations . 2007.
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作成時刻: 2017-02-14 10:54:39 +0900更新時刻: 2017-07-10 20:04:39 +0900